Traceability of high current measurements in short circuit laboratories
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Abstract
To establish traceability for high current measurements, comparison tests of high current shunts in High Power Laboratories have been carried out with STL reference shunts since 2005. This paper describes the comparison test results of shunts in High Power Laboratory CPRI Bangalore. The test results shown are the shunts tested for the comparison tests performed and most of the differences of the scale factor with power frequency current between the reference shunt and those tested in participating laboratories were less than 0.7 %.
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How to Cite
Nagaraj, V., Maroti, ., & Sudhakara Reddy, S. (2014). Traceability of high current measurements in short circuit laboratories. Power Research - A Journal of CPRI, 507–514. Retrieved from https://node6473.myfcloud.com/~geosocin/CPRI/index.php/pr/article/view/793
References
- Final report of European Commission project No. MATI-CT94-0066, “Traceability of High-current Measuring Systems in High Power Laboratories to Standards of Measurement”, 1997.
- STL Technical Report “Traceability of High-current Measuring Systems in High Power Laboratories, by applying calibration procedures using the STL Reference Shunts”, July 2007.
- T Kawamura, E Haginomori, Y Goda and T.Nagumota, “ Recent Developments on High current Measurement using Current Shunt”, IEEJ Trans Vol.2, No.5, September 2007, pp 516-522.
- IEC 62475 Ed. 1.0 2010-09 High Current test techniques: Definition and requirements for the test currents and measuring systems
- Yutaka Goda, Senior Member, IEEE, Maeng Hyun Kim, An Wang, and Gautam Sengupta, “Comparison Tests on High Current Shunts in High Power Laboratories”